INVESTIGATION GROWTH OF GaN NEGATIVE ELECTRON AFFINITY PHOTO-CATHODES MATERIAL
 
                 
                
                    
                                        
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Graphical Abstract
 
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Abstract
    Two to five micrometer thick P-AlxGa1-xN/GaN layers with 0<X≤0.4 were grown by low-pressure metal organic chemical Vapour deposition on sapphire(0001)substrates.For Al cocentrations 0.2<X<0.3 in the AlxGa1-xN layers,The assessment of P-type GaN active layers Shows electron diffusion Lengths of 2 to 5 μm for a doping level of 1×1019/cm3 with neglectible interface recombination.Rep-roducibility of the processing.and furthest development of MOCVD for large scale growth of ultraviolet photo-cathode materials is discussed.
 
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