ANALYSIS ON DEPTH PROFILES OF ITO TRANSPARENT CONDUCTIVE FILMS BY XPS

FAN Chui-zhen; XIE Shu-ping; YANG De-quan

FAN Chui-zhen, XIE Shu-ping, YANG De-quan. ANALYSIS ON DEPTH PROFILES OF ITO TRANSPARENT CONDUCTIVE FILMS BY XPS[J]. VACUUM AND CRYOGENICS, 2001, 7(1): 18-20.

Citation:

FAN Chui-zhen, XIE Shu-ping, YANG De-quan. ANALYSIS ON DEPTH PROFILES OF ITO TRANSPARENT CONDUCTIVE FILMS BY XPS[J]. VACUUM AND CRYOGENICS, 2001, 7(1): 18-20.

Citation:

FAN Chui-zhen, XIE Shu-ping, YANG De-quan. ANALYSIS ON DEPTH PROFILES OF ITO TRANSPARENT CONDUCTIVE FILMS BY XPS[J]. VACUUM AND CRYOGENICS, 2001, 7(1): 18-20.

ANALYSIS ON DEPTH PROFILES OF ITO TRANSPARENT CONDUCTIVE FILMS BY XPS

Graphical Abstract

Graphical Abstract

Abstract

Abstract

The properties of ITO transparent conductive films coated with SiO₂ are introduced.The process of analysis on the depth profiles of the samples by XPS is described and the results are given.

FullText(HTML)

References (0)

Cited By

Turn off MathJax

Article Contents

ANALYSIS ON DEPTH PROFILES OF ITO TRANSPARENT CONDUCTIVE FILMS BY XPS

Graphical Abstract

Abstract

Catalog

Export File

Citation

Format

Content